Qian Yu Tian
at Hebei Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 January 2018
Proc. SPIE. 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Fringe analysis, 3D acquisition, Detection and tracking algorithms, Databases, Fingerprint recognition, Feature extraction, Neural networks, Convolution, Digital Light Processing, 3D image processing

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