Prof. Aaron Lewis
Professor at Hebrew Univ of Jerusalem
SPIE Involvement:
Author | Instructor
Publications (18)

Proceedings Article | 19 March 2015 Paper
Proc. SPIE. 9424, Metrology, Inspection, and Process Control for Microlithography XXIX
KEYWORDS: Gold, Metrology, Etching, Particles, Silicon, Atomic force microscopy, Scanning electron microscopy, Transmission electron microscopy, Raman spectroscopy, Spatial resolution

SPIE Journal Paper | 1 July 2007
JBO Vol. 12 Issue 04
KEYWORDS: Second-harmonic generation, Chromophores, Signal detection, Luminescence, Head, Fiber lasers, Switches, Harmonic generation, Tissue optics, Femtosecond phenomena

Proceedings Article | 20 April 2001 Paper
Proc. SPIE. 4289, WDM and Photonic Switching Devices for Network Applications II
KEYWORDS: Switches, Waveguides, Wavelength division multiplexing, Near field scanning optical microscopy, Near field, Telecommunications, Photonics, Electro optics, Optics manufacturing, Near field optics

Proceedings Article | 2 May 2000 Paper
Proc. SPIE. 3919, Three-Dimensional and Multidimensional Microscopy: Image Acquisition Processing VII
KEYWORDS: Super resolution, Microscopy, Image restoration, Atomic force microscopy, Near field, Deconvolution, Charge-coupled devices, 3D image processing, Near field optics, 3D image restoration

Proceedings Article | 14 June 1999 Paper
Proc. SPIE. 3601, Laser-Tissue Interaction X: Photochemical, Photothermal, and Photomechanical
KEYWORDS: Optical fibers, Thin films, Microscopes, Metals, Glasses, Coating, Laser applications, Laser drilling, Scanning electron microscopy, In vitro testing

Showing 5 of 18 publications
Proceedings Volume Editor (3)

SPIE Conference Volume | 5 December 2001

SPIE Conference Volume | 1 February 1995

SPIE Conference Volume | 1 February 1994

Conference Committee Involvement (15)
Plasmonics: Metallic Nanostructures and Their Optical Properties IX
21 August 2011 | San Diego, California, United States
Plasmonics: Metallic Nanostructures and Their Optical Properties VIII
1 August 2010 | San Diego, California, United States
Plasmonics: Nanoimaging, Nanofabrication, and their Applications V
2 August 2009 | San Diego, California, United States
Plasmonics: Metallic Nanostructures and their Optical Properties VII
2 August 2009 | San Diego, California, United States
Plasmonics: Metallic Nanostructures and Their Optical Properties VI
10 August 2008 | San Diego, California, United States
Showing 5 of 15 Conference Committees
Course Instructor
SC021: The Powerful Potential of Near-field Optics in DWDM Tests and Measurements
The telecommunication component industry is facing serious challenges in the area of tests and measurements of passive and active optical components. This challenge is going to become even more demanding as the era of automated integration of optical components is being entered and the final evolution of an all-optical chip is approached. From the current demands of the optical components industry to the future critical needs of this industry near-field optics based tests and measurements is a new approach with 0.05 micron optical that can resolve present pressing demands of this industry while readily answering the requirement for integrated tests and measurements that the future integrated manufacture of telecom component, subsystem and systems will demand.
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