Aaron M. Michalko
Graduate Researcher at Institute of Optics Univ of Rochester
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | 1 June 2020
OE Vol. 59 Issue 06
KEYWORDS: Wavefronts, Sensors, Mirrors, Wavefront aberrations, Phase retrieval, Freeform optics, Optical engineering, Optical spheres, Metrology, Optical testing

Proceedings Article | 14 September 2018
Proc. SPIE. 10742, Optical Manufacturing and Testing XII
KEYWORDS: Metrology, Wavefronts, Wavefront aberrations, Computer simulations, Optical testing, Phase retrieval, Freeform optics

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