Prof. Abdallah Ougazzaden
at Georgia Tech-Lorraine
SPIE Involvement:
Author
Publications (14)

PROCEEDINGS ARTICLE | March 24, 2015
Proc. SPIE. 9364, Oxide-based Materials and Devices VI
KEYWORDS: Glasses, Ultraviolet radiation, Crystals, Indium, Scanning electron microscopy, Gallium nitride, Sapphire, Indium gallium nitride, Zinc oxide, Industrial chemicals

PROCEEDINGS ARTICLE | April 2, 2014
Proc. SPIE. 8987, Oxide-based Materials and Devices V
KEYWORDS: Thin films, Light emitting diodes, Crystals, Atomic force microscopy, Scanning electron microscopy, Gallium nitride, Sapphire, Wet etching, Zinc oxide, Thin film growth

PROCEEDINGS ARTICLE | March 18, 2013
Proc. SPIE. 8626, Oxide-based Materials and Devices IV
KEYWORDS: Glasses, Crystals, Indium, Gallium nitride, Sapphire, Indium gallium nitride, Zinc oxide, Soda-lime glass, Wafer bonding, Laser liftoff

PROCEEDINGS ARTICLE | March 2, 2012
Proc. SPIE. 8263, Oxide-based Materials and Devices III
KEYWORDS: Glasses, Crystals, X-ray diffraction, Optical microscopy, Scanning electron microscopy, Gallium nitride, Wet etching, Zinc oxide, Wafer bonding, Single crystal X-ray diffraction

PROCEEDINGS ARTICLE | January 21, 2012
Proc. SPIE. 8268, Quantum Sensing and Nanophotonic Devices IX
KEYWORDS: Photodetectors, Ultraviolet radiation, Interfaces, Gallium nitride, Aluminum nitride, Boron, Palladium, Superlattices, Stereolithography, UV optics

PROCEEDINGS ARTICLE | March 11, 2011
Proc. SPIE. 7940, Oxide-based Materials and Devices II
KEYWORDS: Ellipsometry, Refractive index, Data modeling, Ultraviolet radiation, Silicon, Reflectivity, Gallium nitride, Aluminum nitride, Boron, Zinc oxide

Showing 5 of 14 publications
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