Prof. Abdel Rahman M. Zaghloul
at
SPIE Involvement:
Author | Instructor
Publications (15)

PROCEEDINGS ARTICLE | June 18, 2014
Proc. SPIE. 9097, Cyber Sensing 2014
KEYWORDS: Defense and security, Beam splitters, Logic, Switches, Patents, Polarization, Networks, Polarizers, Logic devices, Single sideband modulation

PROCEEDINGS ARTICLE | May 21, 2014
Proc. SPIE. 9099, Polarization: Measurement, Analysis, and Remote Sensing XI
KEYWORDS: Ellipsometry, Polarization, Reflection, Sensors, Electromagnetic radiation, Polarizers, Numerical analysis, Reflectometry, Telecommunications, Signal detection

PROCEEDINGS ARTICLE | September 27, 2013
Proc. SPIE. 8873, Polarization Science and Remote Sensing VI
KEYWORDS: Ellipsometry, Refractive index, Genetic algorithms, Polarization, Reflection, Sensors, Polarizers, Numerical analysis, Mathematics, Signal detection

PROCEEDINGS ARTICLE | October 18, 2007
Proc. SPIE. 6682, Polarization Science and Remote Sensing III
KEYWORDS: Ellipsometry, Refractive index, Polarization, Sensors, Numerical simulations, Electromagnetic radiation, Polarizers, Pellicles, Numerical analysis, Signal detection

PROCEEDINGS ARTICLE | September 20, 2007
Proc. SPIE. 6695, Optics and Photonics for Information Processing
KEYWORDS: Beam splitters, Logic, Patents, Polarization, Electromagnetic radiation, Polarizers, Wave plates, Computer architecture, Binary data, Phase shifts

PROCEEDINGS ARTICLE | September 20, 2007
Proc. SPIE. 6695, Optics and Photonics for Information Processing
KEYWORDS: Thin films, Ellipsometry, Logic, Polarization, Reflection, Electromagnetic radiation, Polarizers, Wave plates, Control systems, Binary data

Showing 5 of 15 publications
Course Instructor
SC1005: Ellipsometry for Thin Film Metrology
This course explains the basic principles and concepts of ellipsometry for thin film diagnostics. A primary goal of the course is to reveal the logic, structure, and methodology behind this useful branch of optical science and engineering. Anyone who wants to answer questions such as, "what can I measure with ellipsometry", "which ellipsometric technique to use?" or "how much confidence is there in the data obtained?" will benefit from taking this course. It unlocks the doors for understanding and using ellipsometry in practical situations.
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