Abdelkader Bellarbi
Doctoral Candidate at Univ d’Evry-Val d’Essonne
SPIE Involvement:
Author
Publications (2)

SPIE Journal Paper | March 16, 2017
JEI Vol. 26 Issue 02
KEYWORDS: Binary data, Sensors, Image segmentation, Corner detection, Machine vision, Computer vision technology, Autoregressive models, Pattern recognition, Augmented reality, Computing systems

PROCEEDINGS ARTICLE | July 1, 1992
Proc. SPIE. 1678, Spectroscopic Characterization Techniques for Semiconductor Technology IV
KEYWORDS: Photoresistors, Gallium arsenide, Silicon, Doping, Raman spectroscopy, Measurement devices, Phonons, Raman scattering, Wet etching, Plasma etching

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