Abdelmalek Boukhenoufa
at GREYC
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 25, 2004
Proc. SPIE. 5470, Noise in Devices and Circuits II
KEYWORDS: Amorphous silicon, Thin films, Image processing, Crystals, Interfaces, Silicon, LCDs, Solids, Transistors, Crystallography

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