Abdul W. Khan
at BeiHang Univ
SPIE Involvement:
Author
Publications (9)

PROCEEDINGS ARTICLE | November 20, 2009
Proc. SPIE. 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Calibration, Matrices, Error analysis, Manufacturing, Reliability, Inspection, Computing systems, Tolerancing, Environmental sensing, Design for manufacturability

PROCEEDINGS ARTICLE | November 20, 2009
Proc. SPIE. 7511, 2009 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
KEYWORDS: Reflectors, Interferometers, Sensors, Calibration, Error analysis, Manufacturing, Kinematics, Humidity, Analytical research, Lens grinding equipment

PROCEEDINGS ARTICLE | May 20, 2009
Proc. SPIE. 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Mirrors, Metrology, Interferometers, Sensors, Calibration, Error analysis, Transducers, Measurement devices, Tolerancing, Environmental sensing

PROCEEDINGS ARTICLE | May 20, 2009
Proc. SPIE. 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: MATLAB, Metrology, Sensors, Calibration, Error analysis, Manufacturing, Optical fabrication, Optical testing, Distance measurement, Standards development

PROCEEDINGS ARTICLE | May 20, 2009
Proc. SPIE. 7283, 4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
KEYWORDS: Metrology, Interferometers, Sensors, Calibration, Error analysis, Manufacturing, Optical testing, Optical alignment, Direct methods, Optics manufacturing

PROCEEDINGS ARTICLE | February 3, 2009
Proc. SPIE. 7160, 2008 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Applications
KEYWORDS: Metrology, Interferometers, Calibration, Error analysis, Manufacturing, Reliability, Kinematics, Direct methods, Environmental sensing, Lead

Showing 5 of 9 publications
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