Prof. Abraham Ogwu
at Univ of the West of Scotland
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | May 18, 2005
Proc. SPIE. 5786, Window and Dome Technologies and Materials IX
KEYWORDS: X-rays, X-ray microscopy, Manufacturing, Surface roughness, Atomic force microscopy, Scanning electron microscopy, Optoelectronics, Boron, Plasma enhanced chemical vapor deposition, Photoemission spectroscopy

PROCEEDINGS ARTICLE | May 18, 2005
Proc. SPIE. 5786, Window and Dome Technologies and Materials IX
KEYWORDS: Polishing, Polarization, Electrodes, Coating, Resistance, Corrosion, Boron, Plasma enhanced chemical vapor deposition, Chemical analysis, Dielectric spectroscopy

PROCEEDINGS ARTICLE | September 26, 2003
Proc. SPIE. 5078, Window and Dome Technologies VIII
KEYWORDS: Semiconductors, Carbon, Diamond, Electrodes, Germanium, Resistance, Optical coatings, Corrosion, Aluminum, Boron

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top