Miss Ada N. Y. Ng
at Univ of Hong Kong
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | February 24, 2005
Proc. SPIE. 5679, Machine Vision Applications in Industrial Inspection XIII
KEYWORDS: Semiconductors, Image processing algorithms and systems, Image fusion, Defect detection, Detection and tracking algorithms, Image segmentation, Image processing, Inspection, Feature extraction, Nanolithography

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