Dr. Adam R. Styk Profile

Dr. Adam R. Styk

Assistant Professor at Warsaw Univ. of Technology

SPIE Involvement:

Conference Program Committee | Author

Publications (21)

PROCEEDINGS ARTICLE | September 7, 2018

Phase shift strategies in phase shifting time averaging interferometry for harmonic motion measurements

Proc. SPIE. 10834, Speckle 2018: VII International Conference on Speckle Metrology

KEYWORDS: Fringe analysis, Phase shifting, Digital signal processing, Interferometry, Bessel functions, Phase shifts

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PROCEEDINGS ARTICLE | August 18, 2018

Vibration amplitude determination through besselogram modulation analysis

Proc. SPIE. 10749, Interferometry XIX

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Error analysis, Interferometry, Bessel functions, Phase shifts

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PROCEEDINGS ARTICLE | August 28, 2016

Recent advances in phase shifted time averaging and stroboscopic interferometry

Proc. SPIE. 9960, Interferometry XVIII

KEYWORDS: Photovoltaics, Phase shifting, Modulation, Visualization, Error analysis, Interferometry, Time metrology, Data processing, Bessel functions, Phase shifts

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PROCEEDINGS ARTICLE | October 8, 2015

Double degree master program: Optical Design

Proc. SPIE. 9793, Education and Training in Optics and Photonics: ETOP 2015

KEYWORDS: Software, Optical design, Computer simulations, Optical testing, Optical metrology, Photonics, Optical engineering, Optics manufacturing, Mechatronics, Internships

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PROCEEDINGS ARTICLE | August 18, 2014

Comparison of full-field interferometric measurement techniques applied to small vibration amplitudes determination

Proc. SPIE. 9203, Interferometry XVII: Techniques and Analysis

KEYWORDS: Modulation, Imaging systems, Cameras, Calibration, Interferometry, Phase shift keying, Modulators, Demodulation, Signal processing, Phase shifts

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PROCEEDINGS ARTICLE | November 3, 2011

Parallel approach to MEMS and micro-optics interferometric testing

Proc. SPIE. 8011, 22nd Congress of the International Commission for Optics: Light for the Development of the World

KEYWORDS: Microelectromechanical systems, Wafer-level optics, Lithium, Diffractive optical elements, Imaging systems, Interferometers, Inspection, Interferometry, Micro optics, Semiconducting wafers

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PROCEEDINGS ARTICLE | May 27, 2011

Vibration amplitude recovery from time averaged interferograms using the directional spatial carrier phase shifting method

Proc. SPIE. 8082, Optical Measurement Systems for Industrial Inspection VII

KEYWORDS: Photovoltaics, Fringe analysis, Phase shifting, Modulation, Error analysis, Interferometry, Reconstruction algorithms, Algorithm development, Bessel functions, Phase shifts

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PROCEEDINGS ARTICLE | September 14, 2010

Smart pixel camera based signal processing in an interferometric test station for massive parallel inspection of MEMS and MOEMS

Proc. SPIE. 7387, Speckle 2010: Optical Metrology

KEYWORDS: Modulation, Imaging systems, Interferometers, Cameras, Inspection, Interferometry, Demodulation, Data processing, Signal processing, Signal detection

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PROCEEDINGS ARTICLE | September 14, 2010

Portable profilometer based on low-coherence interferometry and smart pixel camera

Proc. SPIE. 7387, Speckle 2010: Optical Metrology

KEYWORDS: Mirrors, Beam splitters, Light sources, Light emitting diodes, Imaging systems, Cameras, Optical coherence tomography, Interferometry, Profilometers, Connectors

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PROCEEDINGS ARTICLE | August 2, 2010

Design, technology, and signal processing for DOE-based microinterferometer array applied in new generation M(O)EMS test equipment

Proc. SPIE. 7791, Interferometry XV: Applications

KEYWORDS: Wafer-level optics, Lithium, Imaging systems, Interferometers, Cameras, Inspection, Demodulation, Signal processing, Semiconducting wafers, Diffraction gratings

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PROCEEDINGS ARTICLE | November 20, 2008

Quasi-parallel glass plate measurements using Fizeau interferometer

Proc. SPIE. 7141, 16th Polish-Slovak-Czech Optical Conference on Wave and Quantum Aspects of Contemporary Optics

KEYWORDS: Fringe analysis, Phase shifting, Atrial fibrillation, Modulation, Glasses, Interferometry, Phase shift keying, Optical testing, Mendelevium, Fizeau interferometers

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PROCEEDINGS ARTICLE | August 11, 2008

Fizeau interferometer for quasi parallel optical plate testing

Proc. SPIE. 7063, Interferometry XIV: Techniques and Analysis

KEYWORDS: Refractive index, Fringe analysis, Phase shifting, Atrial fibrillation, Modulation, Interferometry, Phase shift keying, Optical testing, Phase shifts, Fizeau interferometers

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PROCEEDINGS ARTICLE | June 18, 2007

Derivation of quasi-parallel glass plate parameters tested in a Fizeau interferometer

Proc. SPIE. 6616, Optical Measurement Systems for Industrial Inspection V

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Interferometers, Glasses, Interferometry, Phase shift keying, Mendelevium, Phase shifts, Fizeau interferometers

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PROCEEDINGS ARTICLE | August 14, 2006

Detection and assessment of the nonuniform phase displacement error in temporal phase shifting interferometry

Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis

KEYWORDS: Ferroelectric materials, Detection and tracking algorithms, Modulation, Interferometers, Sensors, Calibration, Phase shift keying, Phase interferometry, Double patterning technology, Phase shifts

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PROCEEDINGS ARTICLE | August 14, 2006

Analysis of systematic errors in spatial carrier phase shifting applied to interferogram intensity modulation determination

Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Error analysis, Interferometry, Numerical simulations, Phase shift keying, Data processing, Bessel functions, Phase shifts

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SPIE Journal Paper | August 1, 2006

Interferogram intensity modulation calculations using temporal phase shifting: error analysis

Patorski, Krzysztof , Styk, Adam

OE Vol. 45 Issue 08

KEYWORDS: Modulation, Phase shift keying, Error analysis, Solids, Phase shifts, Optical engineering, Computer simulations, Fringe analysis, Visualization, Phase shifting

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PROCEEDINGS ARTICLE | October 12, 2005

Theory and practice of two-beam interferogram modulation determination

Proc. SPIE. 5958, Lasers and Applications

KEYWORDS: Phase shifting, Modulation, Visualization, Error analysis, Numerical simulations, Phase shift keying, Computer simulations, Solids, Charge-coupled devices, Phase shifts

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PROCEEDINGS ARTICLE | June 13, 2005

Interferogram intensity modulation calculations using temporal phase shifting: error analysis

Proc. SPIE. 5856, Optical Measurement Systems for Industrial Inspection IV

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Visualization, Error analysis, Silicon, Phase shift keying, Solids, Charge-coupled devices, Phase shifts

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SPIE Journal Paper | June 1, 2005

Phase-shifting method contrast calculations in time-averaged interferometry: error analysis

Patorski, Krzysztof , Sienicki, Zbigniew , Styk, Adam

OE Vol. 44 Issue 06

KEYWORDS: Modulation, Phase shift keying, Phase shifts, Error analysis, Solids, Optical engineering, Fringe analysis, Silicon, Bessel functions, Visualization

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PROCEEDINGS ARTICLE | August 17, 2004

Interferometric methods for static and dynamic characterizations of micromembranes for sensing functions

Proc. SPIE. 5458, Optical Micro- and Nanometrology in Manufacturing Technology

KEYWORDS: Ferroelectric materials, Statistical analysis, Electrodes, Silicon, Manufacturing, Interferometry, Phase interferometry, Shape analysis, Semiconducting wafers, Bessel functions

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PROCEEDINGS ARTICLE | August 17, 2004

Studies of the properties of the temporal phase-shifting method applied to silicone microelement vibration investigations using the time-average method

Proc. SPIE. 5458, Optical Micro- and Nanometrology in Manufacturing Technology

KEYWORDS: Fringe analysis, Phase shifting, Modulation, Visualization, Error analysis, Silicon, Phase shift keying, Solids, Bessel functions, Phase shifts

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Showing 5 of 21 publications

Conference Committee Involvement (2)

Interferometry XIX

21 August 2018 | San Diego, California, United States

Interferometry XVIII

30 August 2016 | San Diego, California, United States

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