Dr. Adriana Viorica Szeghalmi
Group Leader at Friedrich-Schiller-Univ Jena
SPIE Involvement:
Author
Publications (10)

PROCEEDINGS ARTICLE | November 16, 2018
Proc. SPIE. 10805, Laser-Induced Damage in Optical Materials 2018: 50th Anniversary Conference
KEYWORDS: Refractive index, Antireflective coatings, Silica, Laser induced damage, Nitrogen, Coating, Laser irradiation, Atomic layer deposition, Wet etching, Laser damage threshold

PROCEEDINGS ARTICLE | June 5, 2018
Proc. SPIE. 10691, Advances in Optical Thin Films VI
KEYWORDS: Carbon, Thin films, Refractive index, FT-IR spectroscopy, Argon, Ions, Oxygen, Atomic layer deposition, Aluminum, Plasma

PROCEEDINGS ARTICLE | June 5, 2018
Proc. SPIE. 10691, Advances in Optical Thin Films VI
KEYWORDS: Refractive index, Antireflective coatings, Silica, Etching, Annealing, Optical coatings, Atomic layer deposition, Transmittance, Thin film coatings

PROCEEDINGS ARTICLE | November 17, 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: Mirrors, Multilayers, Contamination, Particles, Silver, Optical coatings, Reflectivity, Humidity, Atomic layer deposition, Aluminum

PROCEEDINGS ARTICLE | February 20, 2017
Proc. SPIE. 10115, Advanced Fabrication Technologies for Micro/Nano Optics and Photonics X
KEYWORDS: Thin films, Refractive index, Antireflective coatings, Silica, Reflection, Lenses, Glasses, Silicon, Optical coatings, Reflectivity, Atomic layer deposition, Aluminum, Tantalum, Thin film coatings, Thin film deposition

PROCEEDINGS ARTICLE | September 23, 2015
Proc. SPIE. 9627, Optical Systems Design 2015: Advances in Optical Thin Films V
KEYWORDS: Oxides, Refractive index, Silica, Etching, Molecules, Composites, Diffusion, Spectroscopic ellipsometry, Atomic layer deposition, Aluminum

Showing 5 of 10 publications
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