Dr. Adrianus I. Natalisanto
at Mulawarman Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | April 15, 2010
Proc. SPIE. 7522, Fourth International Conference on Experimental Mechanics
KEYWORDS: Refractive index, X-ray computed tomography, Sensors, Glasses, X-rays, Light scattering, Reflectivity, CCD cameras, Tomography, Optical tomography

PROCEEDINGS ARTICLE | May 30, 2003
Proc. SPIE. 5144, Optical Measurement Systems for Industrial Inspection III
KEYWORDS: Diamond, Polarization, Reflection, Sensors, Crystals, X-rays, Photodiodes, Refraction, Computed tomography, Geometrical optics

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