Dr. Aed M. El-Saba
Assistant Professor at Univ of South Alabama
SPIE Involvement:
Conference Program Committee | Author
Publications (39)

PROCEEDINGS ARTICLE | June 11, 2012
Proc. SPIE. 8364, Polarization: Measurement, Analysis, and Remote Sensing X
KEYWORDS: Digital image processing, Polarization, Image processing, Pattern recognition, Image acquisition, Computer programming, Image analysis, Image enhancement, Information security, 3D image processing

PROCEEDINGS ARTICLE | May 27, 2011
Proc. SPIE. 8063, Mobile Multimedia/Image Processing, Security, and Applications 2011
KEYWORDS: Optical filters, Biometrics, Digital image processing, Image processing, Digital filtering, Fingerprint recognition, Fourier transforms, Computer programming, Image filtering, Image enhancement

PROCEEDINGS ARTICLE | April 26, 2011
Proc. SPIE. 8055, Optical Pattern Recognition XXII
KEYWORDS: Image fusion, Biometrics, Polarization, Visualization, Image processing, Fingerprint recognition, Fourier transforms, Computer programming, Image enhancement, Sensor fusion

PROCEEDINGS ARTICLE | May 13, 2010
Proc. SPIE. 7696, Automatic Target Recognition XX; Acquisition, Tracking, Pointing, and Laser Systems Technologies XXIV; and Optical Pattern Recognition XXI
KEYWORDS: Target detection, Image fusion, Detection and tracking algorithms, Polarization, Sensors, Pattern recognition, Reflectivity, Target recognition, Hyperspectral target detection, Data fusion

PROCEEDINGS ARTICLE | May 13, 2010
Proc. SPIE. 7696, Automatic Target Recognition XX; Acquisition, Tracking, Pointing, and Laser Systems Technologies XXIV; and Optical Pattern Recognition XXI
KEYWORDS: Target detection, Signal to noise ratio, Hyperspectral imaging, Detection and tracking algorithms, Sensors, Reflectivity, Spectral resolution, Joint transforms, Automatic target recognition, Hyperspectral target detection

PROCEEDINGS ARTICLE | May 13, 2010
Proc. SPIE. 7696, Automatic Target Recognition XX; Acquisition, Tracking, Pointing, and Laser Systems Technologies XXIV; and Optical Pattern Recognition XXI
KEYWORDS: Detection and tracking algorithms, Polarization, Sensors, Pattern recognition, Wavelets, Fourier transforms, Polarimetry, Image enhancement, Joint transforms, Land mines

Showing 5 of 39 publications
Conference Committee Involvement (6)
Polarization: Measurement, Analysis, and Remote Sensing XI
5 May 2014 | Baltimore, Maryland, United States
Polarization: Measurement, Analysis, and Remote Sensing X
23 April 2012 | Baltimore, Maryland, United States
Polarization: Measurement, Analysis, and Remote Sensing IX
7 April 2010 | Orlando, Florida, United States
Polarization: Measurement, Analysis, and Remote Sensing VIII
18 March 2008 | Orlando, Florida, United States
Polarization: Measurement, Analysis, and Remote Sensing VII
20 April 2006 | Orlando (Kissimmee), Florida, United States
Showing 5 of 6 published special sections
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