Ahmad A. Kanan
at Syracuse Univ
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | December 29, 2004
Proc. SPIE. 5593, Nanosensing: Materials and Devices
KEYWORDS: Refractive index, Optical properties, Sensors, Spectroscopy, Dielectrics, Silicon, Scanning electron microscopy, Picosecond phenomena, Semiconducting wafers, Optical microcavities

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