Ahmad Sinno
at Univ de Versailles Saint-Quentin-en Yvelines
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 14 May 2010
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Actuators, Waveguides, Microscopes, Near field scanning optical microscopy, Metrology, Mirrors, Atomic force microscopy, Ferroelectric materials, Interferometers, Integrated optics

Proceedings Article | 15 September 2007
Proc. SPIE. 6716, Optomechatronic Sensors and Instrumentation III
KEYWORDS: Actuators, Near field scanning optical microscopy, Microscopes, Waveguides, Mirrors, Atomic force microscopy, Ferroelectric materials, Interferometers, Atomic force microscope, Image resolution

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