Ahmed Nouh
Technical Martketing Engr at Mentor Graphics Corp
SPIE Involvement:
Author
Publications (4)

PROCEEDINGS ARTICLE | March 23, 2009
Proc. SPIE. 7272, Metrology, Inspection, and Process Control for Microlithography XXIII
KEYWORDS: Optical components, Visualization, Computing systems, Control systems, Solids, Optical resolution, Optical proximity correction, Data centers, Optical calibration, Resolution enhancement technologies

PROCEEDINGS ARTICLE | October 17, 2008
Proc. SPIE. 7122, Photomask Technology 2008
KEYWORDS: Optical components, Databases, Metals, Control systems, Data processing, Optical resolution, Photomasks, Optical proximity correction, Data centers, Resolution enhancement technologies

PROCEEDINGS ARTICLE | May 3, 2007
Proc. SPIE. 6533, 23rd European Mask and Lithography Conference
KEYWORDS: Lithography, Visualization, Silicon, Computer programming, Very large scale integration, Photomasks, Optical proximity correction, Computer programming languages, Standards development

PROCEEDINGS ARTICLE | March 21, 2007
Proc. SPIE. 6521, Design for Manufacturability through Design-Process Integration
KEYWORDS: Lithography, Visualization, Silicon, Computer programming, Very large scale integration, Photomasks, Optical proximity correction, Neodymium, Computer programming languages

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