Ahmed Nouh
Technical Martketing Engr at Mentor Graphics Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 23 March 2009
Proc. SPIE. 7272, Metrology, Inspection, and Process Control for Microlithography XXIII
KEYWORDS: Data centers, Optical proximity correction, Control systems, Resolution enhancement technologies, Solids, Visualization, Optical components, Optical resolution, Optical calibration, Computing systems

Proceedings Article | 17 October 2008
Proc. SPIE. 7122, Photomask Technology 2008
KEYWORDS: Databases, Optical proximity correction, Data centers, Metals, Photomasks, Control systems, Data processing, Resolution enhancement technologies, Optical components, Optical resolution

Proceedings Article | 3 May 2007
Proc. SPIE. 6533, 23rd European Mask and Lithography Conference
KEYWORDS: Visualization, Optical proximity correction, Computer programming, Computer programming languages, Very large scale integration, Silicon, Standards development, Photomasks, Lithography

Proceedings Article | 21 March 2007
Proc. SPIE. 6521, Design for Manufacturability through Design-Process Integration
KEYWORDS: Optical proximity correction, Visualization, Computer programming, Computer programming languages, Very large scale integration, Silicon, Photomasks, Lithography, Neodymium

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