Dr. Ahmed Ziani
Postdoc CNES - optique XUV at Institut d'Optique Graduate School
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | October 5, 2011
Proc. SPIE. 8168, Advances in Optical Thin Films IV
KEYWORDS: Mirrors, Multilayers, Sputter deposition, Ultraviolet radiation, X-rays, Reflectivity, Reflectometry, Ion beams, Extreme ultraviolet, Aluminum

PROCEEDINGS ARTICLE | October 4, 2011
Proc. SPIE. 8168, Advances in Optical Thin Films IV
KEYWORDS: Multilayers, X-rays, Interfaces, Silicon, Reflectivity, Extreme ultraviolet, Aluminum, Synchrotron radiation, Silicon carbide, Temperature metrology

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