Dr. Aiko K. Ruprecht
Manager Advanced Development at TRIOPTICS GmbH
SPIE Involvement:
Author
Publications (12)

PROCEEDINGS ARTICLE | March 8, 2014
Proc. SPIE. 8992, Photonic Instrumentation Engineering
KEYWORDS: Telescopes, Refractive index, Prisms, Glasses, Spectroscopy, Error analysis, Lamps, Collimators, Autocollimation, Autocollimators

PROCEEDINGS ARTICLE | September 19, 2013
Proc. SPIE. 8844, Optical System Alignment, Tolerancing, and Verification VII
KEYWORDS: Optical components, Refractive index, Mirrors, Light sources, Modulation, Interferometers, Sensors, Interferometry, Optical fabrication, Optics manufacturing

PROCEEDINGS ARTICLE | February 15, 2011
Proc. SPIE. 7926, Micromachining and Microfabrication Process Technology XVI
KEYWORDS: Optical components, Refractive index, Cell phones, Imaging systems, Interferometers, Error analysis, Autocollimators, Objectives, Optical alignment, Optics manufacturing

PROCEEDINGS ARTICLE | May 14, 2010
Proc. SPIE. 7718, Optical Micro- and Nanometrology III
KEYWORDS: Microscopes, Optical sensors, Sensors, Distortion, CCD cameras, Colorimetry, Distance measurement, Charge-coupled devices, CCD image sensors, Optical arrays

PROCEEDINGS ARTICLE | August 29, 2008
Proc. SPIE. 7060, Current Developments in Lens Design and Optical Engineering IX
KEYWORDS: Wafer-level optics, Light sources, Sensors, Wavefront sensors, Wavefronts, Optical testing, Aspheric optics, Aspheric lenses, Modulation transfer functions, Semiconducting wafers

PROCEEDINGS ARTICLE | April 25, 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Microscopes, Telescopes, Light sources, Lenses, Sensors, Wavefront sensors, Wavefronts, Objectives, Modulation transfer functions, Semiconducting wafers

Showing 5 of 12 publications
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