Alaleh Tajalli
at Univ degli Studi di Padova
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2019 Presentation + Paper
Proceedings Volume 10918, 1091817 (2019) https://doi.org/10.1117/12.2511145
KEYWORDS: Gallium nitride, Transistors, Reliability, Field effect transistors, Failure analysis, Diodes, Dielectrics, Diffusion, Physics, Microscopy

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top