Alaleh Tajalli
at Univ degli Studi di Padova
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2019
Proc. SPIE. 10918, Gallium Nitride Materials and Devices XIV
KEYWORDS: Microscopy, Dielectrics, Diffusion, Reliability, Physics, Gallium nitride, Diodes, Transistors, Field effect transistors, Failure analysis

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