Mr. Alan Richard Kramer Profile

Alan Richard Kramer

Applications Engineer

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Publications (2)

Proceedings Article | 29 September 2004

Characterization of C70 doped poly(styrene) –b- poly(hexyl methacrylate) (PS-PHMA) thin film on c–Si substrate with a Jobin Yvon UVISEL phase- modulated spectroscopic ellipsometer (PMSE).

Alan Kramer, Nan Yao, Vincent Pelletier

Proc. SPIE. 5527, Advances in Thin Film Coatings for Optical Applications

KEYWORDS: Carbon, Thin films, Data modeling, Modulation, Polymers, Spectroscopy, Silicon, Doping, Solids, Anisotropy

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Proceedings Article | 18 June 2004

Measurement of organic/polymer material by phase modulation ellipsometry

Yong Ji, Eric Teboul, Alan Kramer

Proc. SPIE. 5351, Organic Photonic Materials and Devices VI

KEYWORDS: Thin films, Ellipsometry, Refractive index, Phase modulation, Optical properties, Polymers, Glasses, Doping, Liquid crystals, Polymer thin films

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