Dr. Alan F. Krauss
Principal Engineer at Schneider Electric
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | April 29, 2004
Proc. SPIE. 5378, Data Analysis and Modeling for Process Control
KEYWORDS: Semiconducting wafers, Sensors, Power supplies, Plasma, Data integration, Signal detection, Photonic integrated circuits, Transducers, Signal attenuation, Metrology

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