Dr. Aland K. Chin
at Aland Chin LLC
SPIE Involvement:
Publications (27)

Proceedings Article | 5 March 2021 Poster + Presentation + Paper
Proceedings Volume 11665, 1166526 (2021) https://doi.org/10.1117/12.2576715
KEYWORDS: Thermal effects, Fiber amplifiers, Diodes, Ytterbium, Semiconductor lasers, Weapons, Wavelength tuning, Scattering, Optical pumping, Optical amplifiers

Proceedings Article | 19 February 2018 Paper
M. Dogan, R. Chin, S. Fulghum, J. Jacob, A. Chin
Proceedings Volume 10514, 105140K (2018) https://doi.org/10.1117/12.2288468
KEYWORDS: Connectors, High power fiber amplifiers, Polarization, Optical amplifiers, Collimation, Semiconductor lasers, Fiber couplers, High power diode lasers, High power fiber coupled lasers, High power fiber lasers

Proceedings Article | 13 March 2015 Paper
A. Chin, A. Nelson, R. Chin, R. Bertaska, J. Jacob
Proceedings Volume 9348, 93480Y (2015) https://doi.org/10.1117/12.2077203
KEYWORDS: Bioalcohols, Electroluminescence, High power lasers, Semiconductor lasers, Corrosion, Diodes, Neodymium, Oxygen, Ultraviolet radiation, Microorganisms

Proceedings Article | 26 February 2013 Paper
A. Chin, J. Manni, R. Chin, J. Levy, M. Dogan, J. Jacob, R. Pathak, C. Wessling, K. Lang, H. Eppich, J. Fryer, T. Haverkamp
Proceedings Volume 8605, 86050P (2013) https://doi.org/10.1117/12.2002230
KEYWORDS: Collimation, Kinematics, Diodes, Polarization, Selenium, Dielectrics, Laser applications, Laser cutting, High power lasers, Fiber lasers

Proceedings Article | 26 February 2013 Paper
Wenyang Sun, Rajiv Pathak, Geoff Campbell, Henry Eppich, J. Jacob, Aland Chin, Jack Fryer
Proceedings Volume 8605, 86050D (2013) https://doi.org/10.1117/12.2004308
KEYWORDS: Surface plasmons, Continuous wave operation, Semiconductor lasers, Resistance, Transmission electron microscopy, Copper, Pulsed laser operation, Thermography, Neodymium

Showing 5 of 27 publications
Proceedings Volume Editor (2)

Conference Committee Involvement (2)
Test and Measurement Applications of Optoelectronic Devices
21 January 2002 | San Jose, California, United States
Testing, Reliability, and Applications of Optoelectronic Devices
24 January 2001 | San Jose, CA, United States
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