Albert G. Beyerle
Manager at Mirmar Sensor LLC
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 September 2005
Proc. SPIE. 5922, Hard X-Ray and Gamma-Ray Detector Physics VII
KEYWORDS: Sensors, Spectroscopy, X-rays, Spectrometers, Amplifiers, Xenon, Gamma radiation, Cesium, Barium, Standards development

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