Albert J. Boehnlein
at Peceptron Inc
SPIE Involvement:
Author
Publications (3)

PROCEEDINGS ARTICLE | March 15, 1994
Proc. SPIE. 2065, Optics, Illumination, and Image Sensing for Machine Vision VIII
KEYWORDS: Moire patterns, Phase shifting, Optical signal processing, Cameras, Calibration, Image processing, Photography, Image restoration, Fourier transforms, Phase shifts

PROCEEDINGS ARTICLE | May 28, 1993
Proc. SPIE. 1821, Industrial Applications of Optical Inspection, Metrology, and Sensing
KEYWORDS: Diffraction, Light sources, Light emitting diodes, Sensors, Manufacturing, Semiconductor lasers, Detector arrays, Head, Thermal effects, Motion measurement

PROCEEDINGS ARTICLE | March 1, 1992
Proc. SPIE. 1614, Optics, Illumination, and Image Sensing for Machine Vision VI
KEYWORDS: Moire patterns, Fringe analysis, Cameras, Phase interferometry, Deflectometry, Heterodyning, Projection systems, Machine vision, Computer aided design, Phase shifts

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