Mr. Albert W. Linder
Section Manager Mission Assurance at Raytheon
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 1, 2015
Proc. SPIE. 9608, Infrared Remote Sensing and Instrumentation XXIII
KEYWORDS: Readout integrated circuits, Semiconductors, Sensors, Reliability, Infrared radiation, Integrated circuits, Human-computer interaction, Semiconducting wafers, Failure analysis, Probability theory

PROCEEDINGS ARTICLE | October 24, 2012
Proc. SPIE. 8511, Infrared Remote Sensing and Instrumentation XX
KEYWORDS: Packaging, Readout integrated circuits, Accelerated life testing, Statistical analysis, Sensors, Metals, Reliability, Signal processing, Integrated circuits, Failure analysis

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top