Albert A. Ohliger
Reliability Technologist at ChevronTexaco
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 April 2003 Paper
Proceedings Volume 5073, (2003) https://doi.org/10.1117/12.499019
KEYWORDS: Infrared radiation, Thermography, Infrared technology, Reliability, Cameras, Infrared cameras, Infrared detectors, Vibrometry, Infrared imaging, Defect detection

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