Albert A. Ohliger
Reliability Technologist at ChevronTexaco
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 April 2003
Proc. SPIE. 5073, Thermosense XXV
KEYWORDS: Infrared detectors, Infrared cameras, Thermography, Infrared imaging, Defect detection, Cameras, Reliability, Vibrometry, Infrared radiation, Infrared technology

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