Mr. Alberto Xavier Pavim
M. Eng. at RWTH Aachen Univ
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | June 17, 2009
Proc. SPIE. 7389, Optical Measurement Systems for Industrial Inspection VI
KEYWORDS: Sensors, Manufacturing, Inspection, Control systems, Optical metrology, Telecommunications, Headlamps, Quality systems, Failure analysis, Data fusion

PROCEEDINGS ARTICLE | May 1, 2008
Proc. SPIE. 6995, Optical Micro- and Nanometrology in Microsystems Technology II
KEYWORDS: Infrared cameras, Thermography, Confocal microscopy, Microscopes, Cameras, Sensors, Inspection, Nondestructive evaluation, Ultrasonics, Machine vision

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Back to Top