Mr. Alberto Xavier Pavim Profile

Alberto Xavier Pavim

M. Eng. at RWTH Aachen Univ

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Proceedings Article | 17 June 2009 Paper

Flexible optical metrology strategies for the control and quality assurance of small series production

R. Schmitt, A. Pavim

Proceedings Volume 7389, 738902 (2009) https://doi.org/10.1117/12.827589

KEYWORDS: Inspection, Sensors, Manufacturing, Data fusion, Headlamps, Optical metrology, Control systems, Telecommunications, Failure analysis, Quality systems

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The demand for achieving smaller and more flexible production series with a considerable diversity of products complicates the control of the manufacturing tasks, leading to big challenges for the quality assurance systems. The quality assurance strategy that is nowadays used for mass production is unable to cope with the inspection flexibility needed among automated small series production, because the measuring strategy is totally dependent on the fixed features of the few manufactured object variants and on process parameters that can be controlled/compensated during production time. The major challenge faced by a quality assurance system applied to small series production facilities is to guarantee the needed quality level already at the first run, and therefore, the quality assurance system has to adapt itself constantly to the new manufacturing conditions. The small series production culture requires a change of paradigms, because its strategies are totally different from mass production. This work discusses the tight inspection requirements of small series production and presents flexible metrology strategies based on optical sensor data fusion techniques, agent-based systems as well as cognitive and self-optimised systems for assuring the needed quality level of flexible small series. Examples of application scenarios are provided among the automated assembly of solid state lasers and the flexible inspection of automotive headlights.

Proceedings Article | 1 May 2008 Paper

Fusion of micro-metrology techniques for the flexible inspection of MEMS/MOEMS assembly

R. Schmitt, A. Pavim

Proceedings Volume 6995, 69950I (2008) https://doi.org/10.1117/12.779952

KEYWORDS: Inspection, Sensors, Ultrasonics, Thermography, Microscopes, Machine vision, Cameras, Infrared cameras, Confocal microscopy, Nondestructive evaluation

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Micro-technology plays an important role in everyday life, without being much perceived. Cell phones, for instance, are daily equipped with small electronic components, which must have their quality level assured. New micro-metrology techniques were developed in the last years for such purposes. They are usually only suited for measuring specific and individual object properties (e.g. geometry, roughness, contours). A multi-sensorial approach is needed to improve the inspection range and flexibility of a micro-production cell, so that the distinct features of different industrial parts may be inspected intelligently and independently of their surface properties. This work provides a basic review on some of the most important "non-contact" micro-metrology techniques (optical and non-optical), performing a comparison of these methods among their distinct capabilities and possible industrial applications/integration scenarios. Based on the already existent sensor fusion principles, the MEOND concept will be introduced to build up flexible inspection systems for small series production by combining sensors and data, focusing possible application scenarios of the micro-world. The fusion of micro-metrology techniques has not yet been far explored and is extremely important to assure flexibility, autonomy, accuracy and robustness for the assembly of MEMS/MOEMS systems.

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