CONFERENCE PROCEEDINGS
Advanced Search
Dr. Albrecht Feltz
at Omicron NanoTechnology GmbH
SPIE Involvement:
Author
Publications (1)
Proceedings Article | 18 August 2005 Paper
Site conditions for high resolution surface analytical systems and environmental influence on instrument performance
Bernd Guenther, A. Feltz, T. Berghaus, A. Bettac
Proceedings Volume 5933, 593302 (2005) https://doi.org/10.1117/12.617365
KEYWORDS: Scanning electron microscopy, Acoustics, Magnetism, Buildings, Scanning tunneling microscopy, Nanotechnology, Electron microscopes, Microscopes, Sensors, Calibration
SIGN IN TO:
  • View contact details
UPDATE YOUR PROFILE
Is this your profile? Update it now.
Sign into your SPIE.org account
Don’t have a profile and want one?
Create an account on SPIE.org
Advertisement
Advertisement
Back to Top