The optical coherence tomography (OCT) is an optical imaging method, which is widely applied in variety applications. This technology is used to cross-sectional or surface imaging with high resolution in non-contact and non-destructive way. OCT is very useful in medical applications like ophthalmology, dermatology or dentistry, as well as beyond biomedical fields like stress mapping in polymers or protective coatings defects detection. Standard OCT imaging is based on intensity images which can visualize the inner structure of scattering devices. However, there is a number of extensions improving the OCT measurement abilities. The main of them are the polarization sensitive OCT (PS-OCT), Doppler enable OCT (D-OCT) or spectroscopic OCT (S-OCT). Our research activities have been focused on PS-OCT systems. The polarization sensitive analysis delivers an useful information about optical anisotropic properties of the evaluated sample. This kind of measurements is very important for inner stress monitoring or e.g. tissue recognition. Based on our research results and knowledge the standard PS-OCT provide only data about birefringence of the measured sample. However, based on the OCT measurements more information including depolarization and diattenuation might be obtained. In our work, the method based on Jones formalism are going to be presented. It is used to determine birefringence, dichroism and optic axis orientation of the tested sample. In this contribution the setup of the optical system, as well as tests results verifying the measurements abilities of the system are going to be presented. The brief discussion about the effectiveness and usefulness of this approach will be carried out.
The profilometry plays a huge role in the most fields of science and technology. It allows to measure the profile of the surface with high-resolution. This technique is used in the fields like optic, electronic, medicine, automotive, and much more. The aim of the current work was to design and build optical profilometer based on the interference phenomena. The developed device has been working with He-Ne laser (632.8 nm). The optical parts have been chosen in order to reach the sized 2.0 mm x 1.6 mm of scanning area. The setup of the profilometer is based on Twyman-Green interferometer. Therefore, the phase distribution of the backreflected light from measured surface is recorded. The measurements are carried out with the aid of multiframe algorithms. In this approach we have used the Hariharan algorithm to obtain the exact value of the recorded phase. During tests, which have been carried out in order to check the functionality of the device, the interference patterns have been recoded and processed in order to obtain the 3D profile of measured surface. In this contribution the setup of the optical system, as well as signal processing methods are going to be presented. The brief discussion about the advantages and disadvantages, and usefulness of this approach will be carried out.