Dr. Alex Behfar
Chairman at Odyssey Semiconductor, Inc.
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 8 February 2007 Paper
Alfred Schremer, Cristian Stagarescu, Jeff Hwang, Fareen Khaja, Vinu Vainateya, Alan Morrow, Alex Behfar
Proceedings Volume 6473, 64731F (2007) https://doi.org/10.1117/12.701425
KEYWORDS: Mirrors, Semiconducting wafers, Laser damage threshold, Etching, Laser applications, Gallium nitride, Pulsed laser operation, Coating, Wafer testing, Laser development

Proceedings Article | 6 October 2006 Paper
Malcolm Green, Alex Behfar, Alan Morrow, Al Schremer, Cristian Stagarescu
Proceedings Volume 6352, 63520U (2006) https://doi.org/10.1117/12.689153
KEYWORDS: Photodiodes, Reflectivity, Semiconducting wafers, Packaging, Etching, Laser resonators, Laser applications, Waveguide lasers, Diodes, Laser damage threshold

Proceedings Article | 3 March 2006 Paper
Alex Behfar, Alfred Schremer, Jeff Hwang, Cristian Stagarescu, Alan Morrow, Malcolm Green
Proceedings Volume 6121, 61210P (2006) https://doi.org/10.1117/12.646629
KEYWORDS: Gallium nitride, Etching, Laser applications, Reflectivity, Sapphire, Mirrors, Semiconductor lasers, Ion beams, Gallium arsenide, Semiconducting wafers

Proceedings Article | 14 March 2005 Paper
Alex Behfar, Alfred Schremer, Malcolm Green, Cristian Stagarescu, Alan Morrow
Proceedings Volume 5737, (2005) https://doi.org/10.1117/12.591069
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Reflectivity, Laser resonators, Mirrors, Etching, Gallium arsenide, Laser applications, Optical coatings, Fabrication

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