Dr. Alex Behfar
Chairman & CEO at BinOptics Corp
SPIE Involvement:
Author
Publications (4)

Proceedings Article | 8 February 2007
Proc. SPIE. 6473, Gallium Nitride Materials and Devices II
KEYWORDS: Mirrors, Semiconducting wafers, Laser damage threshold, Etching, Laser applications, Gallium nitride, Pulsed laser operation, Coating, Wafer testing, Laser development

Proceedings Article | 6 October 2006
Proc. SPIE. 6352, Optoelectronic Materials and Devices
KEYWORDS: Photodiodes, Reflectivity, Semiconducting wafers, Packaging, Etching, Laser resonators, Laser applications, Waveguide lasers, Diodes, Laser damage threshold

Proceedings Article | 3 March 2006
Proc. SPIE. 6121, Gallium Nitride Materials and Devices
KEYWORDS: Gallium nitride, Etching, Laser applications, Reflectivity, Sapphire, Mirrors, Semiconductor lasers, Ion beams, Gallium arsenide, Semiconducting wafers

Proceedings Article | 14 March 2005
Proc. SPIE. 5737, Vertical-Cavity Surface-Emitting Lasers IX
KEYWORDS: Vertical cavity surface emitting lasers, Semiconducting wafers, Reflectivity, Laser resonators, Mirrors, Etching, Gallium arsenide, Laser applications, Optical coatings, Fabrication

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