Dr. Alex Ulyanenkov Profile

Dr. Alex Ulyanenkov

at Bruker AXS GmbH

SPIE Involvement:

Author

Publications (1)

Proceedings Article | 21 October 2004 Paper

Alex Ulyanenkov

Proceedings Volume 5536, (2004) https://doi.org/10.1117/12.563302

KEYWORDS: X-rays, X-ray diffraction, Crystals, Reflectivity, Diffraction, Data modeling, Scattering, Statistical modeling, Databases, Superlattices

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Keywords/Phrases