Dr. Alex Ulyanenkov
at Bruker AXS GmbH
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | October 21, 2004
Proc. SPIE. 5536, Advances in Computational Methods for X-Ray and Neutron Optics
KEYWORDS: Diffraction, Data modeling, Scattering, Databases, Crystals, X-rays, X-ray diffraction, Reflectivity, Superlattices, Statistical modeling

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