Dr. Alexander Blättermann
at Fraunhofer-IPM
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 21 June 2019 Presentation + Paper
Proc. SPIE. 11056, Optical Measurement Systems for Industrial Inspection XI
KEYWORDS: Light emitting diodes, Contamination, Cameras, Sensors, Metals, Particles, Inspection, Head, Aluminum, Modulation transfer functions

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