Dr. Alexander R. Bruccoleri
Founder at Izentis LLC at Izentis LLC
SPIE Involvement:
Publications (28)

Proceedings Article | 10 April 2024 Presentation
Proceedings Volume 12955, 129550Z (2024) https://doi.org/10.1117/12.3010409
KEYWORDS: Diffraction gratings, X-rays, Semiconducting wafers, X-ray diffraction, Metrology, Fabrication, Etching, Spectrometers, Spectral resolution, Reflection

Proceedings Article | 5 October 2023 Presentation + Paper
Proceedings Volume 12679, 126790L (2023) https://doi.org/10.1117/12.2676797
KEYWORDS: Diffraction gratings, Blazed gratings, X-rays, Semiconducting wafers, Diffraction, Silicon, Spectroscopy, Etching

Proceedings Article | 31 August 2022 Presentation + Paper
Proceedings Volume 12181, 1218116 (2022) https://doi.org/10.1117/12.2628195
KEYWORDS: X-ray astronomy, X-ray optics, X-ray telescopes, X-ray technology, Diffraction gratings, X-rays, Diffraction, Silicon, Spectral resolution, Tolerancing, Spectroscopy, Semiconducting wafers, Ray tracing

Proceedings Article | 26 August 2022 Presentation
Proceedings Volume 12181, 1218115 (2022) https://doi.org/10.1117/12.2630349
KEYWORDS: Mirrors, X-rays, Epoxies, Silicates, X-ray telescopes, Silica, Photovoltaics, Optical fabrication

Proceedings Article | 23 August 2021 Presentation + Paper
Ralf Heilmann, Alexander Bruccoleri, Jungki Song, Bethany Levenson, Brian Smallshaw, Mallory Whalen, Alan Garner, Sarah Trowbridge Heine, Herman Marshall, Matthew Cook, James Gregory, Renee Lambert, Dmitri Shapiro, Douglas Young, Eric Gullikson, Tomoyuki Nonaka, Akimi Uchida, Manuel Quijada, Ed Hertz, Peter Cheimets, Randall Smith, Mark Schattenburg
Proceedings Volume 11822, 1182215 (2021) https://doi.org/10.1117/12.2594951
KEYWORDS: Diffraction gratings, Computed tomography, Semiconducting wafers, X-rays, Diffraction, Etching, Deep reactive ion etching, Photomasks, Optical alignment, X-ray diffraction

Showing 5 of 28 publications
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