Mr. Alexander Guggenmos
at Ludwig-Maximilians-Univ München
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 5, 2014
Proc. SPIE. 9207, Advances in X-Ray/EUV Optics and Components IX
KEYWORDS: Mirrors, Multilayers, X-ray optics, Polishing, Interfaces, Reflectivity, Chromium, Transmission electron microscopy, Ion beams, Scandium

PROCEEDINGS ARTICLE | October 15, 2012
Proc. SPIE. 8502, Advances in X-Ray/EUV Optics and Components VII
KEYWORDS: Mirrors, Multilayers, Dispersion, X-rays, Interfaces, Reflectivity, Reflectometry, Ion beams, Extreme ultraviolet, X-ray characterization

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