Prof. Alexander W. Koch
Chair and Director at the Institute at Technische Univ München
SPIE Involvement:
Conference Program Committee | Author | Student Chapter Advisor
Publications (44)

PROCEEDINGS ARTICLE | November 16, 2017
Proc. SPIE. 10563, International Conference on Space Optics — ICSO 2014
KEYWORDS: Optical fibers, Fiber optics, Fiber Bragg gratings, Sensors, Satellites, Fiber optics sensors, Transducers, Aluminum, Astronomical imaging, Temperature metrology

PROCEEDINGS ARTICLE | August 23, 2017
Proc. SPIE. 10373, Applied Optical Metrology II
KEYWORDS: Fringe analysis, Metrology, Opto mechatronics, Speckle, Surface roughness, Interferometry, Optical testing, Optical interferometry, Analytical research, Visibility

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Diffraction, Fringe analysis, Modulation, Inspection, Interferometry, Wavefronts, Modulators, Spatial light modulators, Liquid crystals, Phase shifts

PROCEEDINGS ARTICLE | May 5, 2017
Proc. SPIE. 10210, Next-Generation Spectroscopic Technologies X
KEYWORDS: Microbolometers, Thermography, Optical components, Fourier spectroscopy, Refractive index, Beam splitters, FT-IR spectroscopy, Data modeling, Sensors, Spectroscopy, Spectrometers, Fourier transforms, Infrared spectroscopy, Detector arrays, Infrared radiation, Spectrometer engineering, Temperature metrology

PROCEEDINGS ARTICLE | April 28, 2017
Proc. SPIE. 10213, Hyperspectral Imaging Sensors: Innovative Applications and Sensor Standards 2017
KEYWORDS: Hyperspectral imaging, Thin films, Reflection, Imaging systems, Polymers, Reflectivity, Computer simulations, Reflectometry, Neural networks, Neurons

PROCEEDINGS ARTICLE | April 27, 2017
Proc. SPIE. 10208, Fiber Optic Sensors and Applications XIV
KEYWORDS: Fiber optics, Polarization, Birefringence, Fiber Bragg gratings, Sensors, Signal attenuation, Calibration, Reflectivity, Fiber optics sensors, Temperature metrology

Showing 5 of 44 publications
Conference Committee Involvement (1)
Interferometry XII: Applications
4 August 2004 | Denver, Colorado, United States
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