Alexander Krupinski-Ptaszek
at Univ. of Warsaw
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 1 March 2019
Proc. SPIE. 10934, Optical, Opto-Atomic, and Entanglement-Enhanced Precision Metrology
KEYWORDS: Signal to noise ratio, Confocal microscopy, Diffraction, Point spread functions, Super resolution, Sensors, Microscopy, Single photon, Image resolution, Image enhancement

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top