Dr. Alexander Philippou
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 23 March 2012 Paper
Proceedings Volume 8322, 83221D (2012) https://doi.org/10.1117/12.917804
KEYWORDS: Line width roughness, Calibration, Data modeling, Stochastic processes, Extreme ultraviolet, Semiconducting wafers, Photomasks, Cadmium, Scanning electron microscopy, Photons

Proceedings Article | 20 May 2011 Paper
Proceedings Volume 8081, 80810R (2011) https://doi.org/10.1117/12.899901
KEYWORDS: Ellipsometry, Lithography, Semiconducting wafers, Signal processing, Signal detection, Diffraction, Etching, Photoresist processing, Nanoimprint lithography, Wafer-level optics

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