Mr. Alexander Pravdivstev
Application Engineer at Frontier Semiconductor Inc
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | September 10, 2007
Proc. SPIE. 6672, Advanced Characterization Techniques for Optics, Semiconductors, and Nanotechnologies III
KEYWORDS: Semiconductors, Thin films, Lithography, Metrology, Coherence (optics), Interferometers, Image resolution, Phase interferometry, Semiconducting wafers, Fizeau interferometers

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6293, Interferometry XIII: Applications
KEYWORDS: Optical fibers, Mirrors, Visible radiation, Coherence (optics), Fiber optics, Interferometers, Sensors, Scanners, Infrared radiation, Semiconducting wafers

PROCEEDINGS ARTICLE | August 14, 2006
Proc. SPIE. 6292, Interferometry XIII: Techniques and Analysis
KEYWORDS: Wafer-level optics, Optical fibers, Mirrors, Coherence (optics), Fiber optics, Interferometers, Etching, Scanners, Silicon, Semiconducting wafers

PROCEEDINGS ARTICLE | January 23, 2006
Proc. SPIE. 6109, Micromachining and Microfabrication Process Technology XI
KEYWORDS: Thin films, Refractive index, Fiber optics, Interferometers, Sensors, Silicon, Reflectivity, Interferometry, Reflectometry, Semiconducting wafers

PROCEEDINGS ARTICLE | January 6, 2006
Proc. SPIE. 6111, Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS V
KEYWORDS: Microelectromechanical systems, Interferometers, Sensors, Spectroscopy, Silicon, Interferometry, Raman spectroscopy, Reflectometry, Infrared radiation, Semiconducting wafers

PROCEEDINGS ARTICLE | August 18, 2005
Proc. SPIE. 5880, Optical Diagnostics
KEYWORDS: Semiconductors, Metrology, Coherence (optics), Interferometers, Silicon, Reflectivity, Interferometry, Semiconductor manufacturing, Semiconducting wafers, Michelson interferometers

Showing 5 of 7 publications
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