Prof. Alexander Scheeline
President at SpectroClick Inc
SPIE Involvement:
Conference Chair | Author | Editor | Instructor
Publications (7)

PROCEEDINGS ARTICLE | June 3, 2015
Proc. SPIE. 9482, Next-Generation Spectroscopic Technologies VIII
KEYWORDS: Signal to noise ratio, Diffraction, Visible radiation, Light emitting diodes, Cameras, Sensors, Spectroscopy, Spectrometers, Diffraction gratings, Absorption

PROCEEDINGS ARTICLE | May 5, 2009
Proc. SPIE. 7306, Optics and Photonics in Global Homeland Security V and Biometric Technology for Human Identification VI
KEYWORDS: Microfluidics, Proteins, Optical amplifiers, Capillaries, Interfaces, Chemistry, Transducers, Chemical analysis, Analytical research, Chemiluminescence

PROCEEDINGS ARTICLE | April 3, 1995
Proc. SPIE. 2386, Ultrasensitive Instrumentation for DNA Sequencing and Biochemical Diagnostics
KEYWORDS: Sensors, Spectroscopy, Chemistry, Magnetism, Computing systems, Mass spectrometry, Signal processing, Chemical analysis, Chemometrics, Spectroscopes

PROCEEDINGS ARTICLE | March 1, 1994
Proc. SPIE. 2037, Chaos/Nonlinear Dynamics: Methods and Commercialization
KEYWORDS: Mathematical modeling, Modeling, Oscillators, Electrodes, Complex systems, Control systems, Ordinary differential equations, Systems modeling, Model-based design, Chaos

PROCEEDINGS ARTICLE | November 5, 1993
Proc. SPIE. 2036, Chaos in Biology and Medicine
KEYWORDS: Oscillators, Spectroscopy, Bioalcohols, Control systems, Oxygen, Time metrology, Absorbance, In vitro testing, Absorption, Oxidation

Showing 5 of 7 publications
Conference Committee Involvement (1)
Ultrasensitive Instrumentation for DNA Sequencing and Biochemical Diagnostics
8 February 1995 | San Jose, CA, United States
Course Instructor
SC853: Tradeoffs in Spectrometer System Design
This course provides attendees with an overview of spectrochemical measurements and the instrumental parameters one must choose to obtain valid, precise results. Matching component specifications for an optimal overall design is emphasized. Time, space, and energy resolution, and the influence of noise, are considered. Components such as light sources, gratings, beam-splitters, lenses, mirrors, prisms, and detectors are discussed, as are their combination into absorbance, fluorescence, and scattering spectrometers. Optical aberrations and their influence on resolution and precision are emphasized. High resolution measurement problems (atomic spectroscopy, gas phase diagnostics) are contrasted with low-resolution problems (trace detection in solution).
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