Dr. Alexander Suppes
at GE Inspection Technologies GmbH
SPIE Involvement:
Author
Publications (2)

PROCEEDINGS ARTICLE | September 20, 2010
Proc. SPIE. 7804, Developments in X-Ray Tomography VII
KEYWORDS: Metrology, Optical spheres, X-ray computed tomography, Calibration, X-rays, Inspection, Distance measurement, 3D metrology, Dimensional metrology, Computed tomography

PROCEEDINGS ARTICLE | September 18, 2008
Proc. SPIE. 7078, Developments in X-Ray Tomography VI
KEYWORDS: Metrology, Optical spheres, X-ray computed tomography, Fluctuations and noise, Sensors, Calibration, X-rays, Distance measurement, Dimensional metrology, Standards development

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