Prof. Alexander V. Tikhonravov Profile

Prof. Alexander V. Tikhonravov

Professor, Research Supervisor at MV Lomonosov Moscow State Univ

SPIE Involvement:

Conference Program Committee | Author

Publications (47)

Proceedings Article | 12 September 2021 Presentation + Paper

Optical monitoring of coating production: correlation of errors and errors self-compensation

Alexander Tikhonravov, Igor Kochikov, Svetlana Sharapova, Anatoly Yagola

Proceedings Volume 11872, 118720Q (2021) https://doi.org/10.1117/12.2597765

KEYWORDS: Error analysis, Optics manufacturing, Coating, Manufacturing, Optical filters, Geometrical optics, Statistical analysis, Computer simulations, Optical coatings, Refractive index

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Proceedings Article | 5 June 2018 Paper

High performance atomistic simulation of thin films porosity and surface structure

F. Grigoriev, V. Sulimov, A. Tikhonravov

Proceedings Volume 10691, 1069109 (2018) https://doi.org/10.1117/12.2312707

KEYWORDS: Chemical species, Thin films, Silicon, Monte Carlo methods, Silica, Surface roughness, Algorithm development, Spherical lenses, Computer simulations, Device simulation

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Proceedings Article | 5 June 2018 Paper

Broad band optical monitoring of large area coatings produced using planetary rotation

Valery Zhupanov, Viktor Fedoseev, Pavel Novikov, Dmitry Pavlyshin, Ivan Kozlov, Alexander Tikhonravov

Proceedings Volume 10691, 106910F (2018) https://doi.org/10.1117/12.2311445

KEYWORDS: Transmittance, Optical coatings, Polarizers, Refractive index, Planetary systems, Thin films, Calibration

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Proceedings Article | 1 December 2017 Paper

Thin films structural properties: results of the full-atomistic supercomputer simulation

F. Grigoriev, V. Sulimov, A. Tikhonravov

Proceedings Volume 10603, 106030F (2017) https://doi.org/10.1117/12.2292420

KEYWORDS: Silica, Thin films, Thin film growth, Deposition processes

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Proceedings Article | 23 September 2015 Paper

Design and pre-production analysis of optical coatings

Alexander Tikhonravov

Proceedings Volume 9627, 962705 (2015) https://doi.org/10.1117/12.2191622

KEYWORDS: Error analysis, Coating, Optical filters, Optical coatings, Optics manufacturing, Optical design, Reflectivity, Thin films, Refractive index, Transmittance

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Proceedings Article | 23 September 2015 Paper

Design, production, and reverse engineering of a double sided innovative thin film laser element

Michael Trubetskov, Tatiana Amotchkina, Alexander Tikhonravov, Laszlo Veisz, Vladimir Pervak

Proceedings Volume 9627, 96270X (2015) https://doi.org/10.1117/12.2191120

KEYWORDS: Antireflective coatings, Autoregressive models, Silica, Optical components, Reflectivity, Coating, Thin films, Optical design, Error analysis, Mirrors

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Proceedings Article | 23 September 2015 Paper

Design and production of three line antireflection coatings for visible and far infrared spectral regions

Valeriy Zhupanov, Viktor Fedoseev, Michael Trubetskov, Tatiana Amotchkina, Alexander Tikhonravov

Proceedings Volume 9627, 962706 (2015) https://doi.org/10.1117/12.2191161

KEYWORDS: Refractive index, Reflectivity, Thin films, Antireflective coatings, Zinc, Coating, Visible radiation, Reverse engineering, Manufacturing, Reflection

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Proceedings Article | 23 September 2015 Paper

Supercomputer modeling of the ion beam sputtering process: full-atomistic level

F. Grigoriev, A. Sulimov, I. Kochikov, O. Kondakova, V. Sulimov, A. Tikhonravov

Proceedings Volume 9627, 962708 (2015) https://doi.org/10.1117/12.2190938

KEYWORDS: Chemical species, Silica, Silicon, Glasses, Systems modeling, Deposition processes, Thin films, Sputter deposition, Crystals, Ion beams

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Proceedings Article | 5 October 2011 Paper

Robust synthesis of dispersive mirrors

V. Pervak, M. Trubetskov, A. Tikhonravov

Proceedings Volume 8168, 81680E (2011) https://doi.org/10.1117/12.896527

KEYWORDS: Mirrors, Clouds, Reflectivity, Coating, Manufacturing, Error analysis, Oscillators, Ultrafast phenomena, Femtosecond phenomena, Interferometers

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Proceedings Article | 4 October 2011 Paper

Broadband monitoring simulation with massively parallel processors

Mikhail Trubetskov, Tatiana Amotchkina, Alexander Tikhonravov

Proceedings Volume 8168, 81681D (2011) https://doi.org/10.1117/12.896522

KEYWORDS: Optical coatings, Transmittance, Optics manufacturing, Manufacturing, Computer simulations, Parallel computing, Software development, Computing systems, Optical design, Probability theory

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Proceedings Article | 4 October 2011 Paper

Design of multilayer coatings containing metal island films

Tatiana Amotchkina, Jordi Sancho-Parramon, Vesna Janicki, Michael Trubetskov, Hrvoje Zorc, Alexander Tikhonravov

Proceedings Volume 8168, 816809 (2011) https://doi.org/10.1117/12.896181

KEYWORDS: Metals, Silver, Silica, Optical coatings, Thin films, Reflectivity, Multilayers, Transmittance, Refractive index, Optical properties

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Proceedings Article | 18 February 2011 Paper

Design and monitoring approaches for the production of high quality optical coatings

Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 7995, 79951Q (2011) https://doi.org/10.1117/12.888252

KEYWORDS: Optical coatings, Optics manufacturing, Optical engineering, Optical design, Transmittance, Optical filters, Linear filtering, Reflectivity, Thin film coatings, Design for manufacturability

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Proceedings Article | 31 December 2009 Paper

Design consideration for high damage threshold UV-Vis-IR mirrors

V. Pervak, M. Trubetskov, A. Tikhonravov

Proceedings Volume 7504, 75040A (2009) https://doi.org/10.1117/12.835787

KEYWORDS: Mirrors, Laser damage threshold, Multilayers, Silica, Femtosecond phenomena, Laser optics, Standards development, UV optics, Nonlinear optics, Ultrafast phenomena

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Proceedings Article | 25 September 2008 Paper

Estimation for the number of layers of broad band anti-reflection coatings

Tatiana Amotchkina, Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 7101, 710104 (2008) https://doi.org/10.1117/12.796590

KEYWORDS: Autoregressive models, Reflectivity, Refractive index, Antireflective coatings, Solids, Thin film coatings, Thin films, Optical coatings, Structural design, Lanthanum

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Proceedings Article | 14 May 2007 Paper

Software tools for studying optical manufacturability with modern monochromatic monitoring devices

Alexander Tikhonravov, Michael Trubetskov, Jennifer Kruschwitz, Alfons Zoller, Harro Hagedorn, Boris Romanov, Michael Boos

Proceedings Volume 10316, 103161K (2007) https://doi.org/10.1117/12.718119

KEYWORDS: Optical coatings, Optics manufacturing, Coating, Mirrors, Transmittance, Error analysis, Refractive index, Optical engineering, Manufacturing, Optical fabrication

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Proceedings Article | 5 October 2005 Paper

New optimization algorithm for the synthesis of rugate optical coatings

Alexander Tikhonravov, Michael Trubetskov, Tatiana Amochkina, Michael Kokarev, Norbert Kaiser, Olaf Stenzel, Steffen Wilbrandt, Dieter Gäbler

Proceedings Volume 5963, 596304 (2005) https://doi.org/10.1117/12.625072

KEYWORDS: Refractive index, Multilayers, Optical coatings, Reflectivity, Thin film coatings, Thin films, Optimization (mathematics), Optical design, Tolerancing, Optical filters

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Proceedings Article | 19 August 2005 Paper

Virtual deposition plant

Alexander Tikhonravov

Proceedings Volume 5870, 58700D (2005) https://doi.org/10.1117/12.617043

KEYWORDS: Transmittance, Manufacturing, Linear filtering, Beam splitters, Optics manufacturing, Optical coatings, Deposition processes, Signal processing, Computer simulations, Data acquisition

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Proceedings Article | 25 February 2004 Paper

Key role of the coating total optical thickness in solving design problems

Alexander Tikhonravov, Michael Trubetskov, Tatiana Amotchkina, Michael Kokarev

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513326

KEYWORDS: Optical design, Coating, Optical coatings, Fourier transforms, Transmittance, Bandpass filters, Reflectivity, Optical engineering, Refractive index, Optical filters

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Proceedings Article | 25 February 2004 Paper

Online characterization and reoptimization of optical coatings

Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.513379

KEYWORDS: Coating, Optical coatings, Thin films, Refractive index, Transmittance, Data modeling, Thin film coatings, Algorithm development, Deposition processes, Sputter deposition

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Proceedings Article | 25 February 2004 Paper

Optical metrology of thin films using high-accuracy spectrophotometric measurements with oblique angles of incidence

Saulius Nevas, Farshid Manoocheri, Erkki Ikonen, Alexander Tikhonravov, Michail Kokarev, Michail Trubetskov

Proceedings Volume 5250, (2004) https://doi.org/10.1117/12.512700

KEYWORDS: Transmittance, Thin films, Refractive index, Spectrophotometry, Polarization, Collimation, Optical testing, Reflectivity, Refraction, Absorption

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Proceedings Article | 19 November 2003 Paper

Application of advanced optimization concepts to the design of high quality optical coatings

Alexander Tikhonravov, Michael Trubetskov, Tatiana Amotchkina, Andrei Tikhonravov

Proceedings Volume 4829, (2003) https://doi.org/10.1117/12.531110

KEYWORDS: Optical coatings, Reflectivity, Optical design, Multilayers, Optimization (mathematics), Deposition processes, Tin, Physics, Telecommunications, Semiconductors

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Proceedings Article | 4 November 2003 Paper

Reliable determination of wavelength dependence of thin film refractive index

Alexander Tikhonravov, Michael Trubetskov, Tatiana Amotchkina, Andrei Tikhonravov, Detlev Ristau, Stefan Gunster

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.505554

KEYWORDS: Refractive index, Reflectivity, Thin films, Data modeling, Mirrors, Solids, Vacuum ultraviolet, Transmittance, Magnesium fluoride, Coating

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Proceedings Article | 4 November 2003 Paper

Accuracy of optical thin film parameter determination based on spectrophotometric data

Alexander Tikhonravov, Michael Trubetskov, Gary DeBell

Proceedings Volume 5188, (2003) https://doi.org/10.1117/12.505499

KEYWORDS: Transmittance, Refractive index, Thin films, Data modeling, Dielectrics, Error analysis, Silica, Tantalum, Absorption, Thin film coatings

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Proceedings Article | 29 September 1999 Paper

Optimal design of graded x-ray multilayer mirrors in the angular and spectral domains

Vladimir Protopopov, Alexander Tikhonravov, Andrei Voronov, Michael Trubetskov, Gary DeBell

Proceedings Volume 3766, (1999) https://doi.org/10.1117/12.363645

KEYWORDS: Mirrors, X-rays, Reflectivity, Multilayers, Reflection, Tungsten, Interfaces, X-ray technology, Structural design, Carbon

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Proceedings Article | 7 September 1999 Paper

Sensitivity of the ellipsometric angles psi and delta to the surface inhomogeneity

Alexander Tikhonravov, Michael Trubetskov, Enrico Masetti, A. Krasilnikova, I. Kochikov

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360078

KEYWORDS: Refractive index, Statistical modeling, Reflection, Thin films, Surface plasmons, Quartz, Data modeling, Quantum wells, Ions, Protactinium

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Proceedings Article | 7 September 1999 Paper

Ellipsometric study of optical properties and small inhomogeneities of Nb2O5 films

Alexander Tikhonravov, Michael Trubetskov, Glen Clarke, Brian Sullivan, Jerzy Dobrowolski

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360079

KEYWORDS: Data modeling, Thin films, Quantum wells, Refractive index, Optical properties, Spectroscopic ellipsometry, Niobium, Quartz, Sputter deposition, Spectroscopy

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Proceedings Article | 7 September 1999 Paper

Designing of coatings for femtosecond lasers with phase derivative targets

Alexander Tikhonravov, Michael Trubetskov, Ursula Keller, Nicolai Matuschek

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360083

KEYWORDS: Transmittance, Output couplers, Refractive index, Phase shifts, Femtosecond phenomena, Optical coatings, Thulium, Solids, Multilayers, Reflectors

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Proceedings Article | 7 September 1999 Paper

UV-optical and microstructural properties of MgF2-coatings deposited by IBS and PVD processes

Detlev Ristau, Winfried Arens, Salvador Bosch, Angela Duparre, Enrico Masetti, Damien Jacob, George Kiriakidis, Francesca Peiro, Etienne Quesnel, Alexander Tikhonravov

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360111

KEYWORDS: Silicon, Optical coatings, Reflectivity, Magnesium fluoride, Refractive index, Surface roughness, Sputter deposition, Thin film coatings, Deposition processes, Thin films

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Proceedings Article | 7 September 1999 Paper

Push-button technology in optical coating design: pro et contra

Alfred Thelen, Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360082

KEYWORDS: Transmittance, Optical design, Refractive index, Bandpass filters, Optical coating design, Optical coatings, Coating, Tolerancing, Astatine, Optics manufacturing

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Proceedings Article | 7 September 1999 Paper

Application of the needle optimization technique to the design of x-ray mirrors

Alexander Tikhonravov, Michael Trubetskov, Vladimir Protopopov, Andrei Voronov

Proceedings Volume 3738, (1999) https://doi.org/10.1117/12.360087

KEYWORDS: Reflectivity, Mirrors, X-rays, Reflection, X-ray technology, Surface roughness, Standards development, X-ray lithography, Thin films, X-ray optics

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Proceedings Article | 1 October 1997 Paper

Design of coatings for wide angular range applications

Alexander Tikhonravov, Michael Trubetskov, Gary DeBell

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.290196

KEYWORDS: Refractive index, Optical coatings, Transmittance, Polarizers, Beam splitters, Optical design, Glasses, Thin film coatings, Thin films, Multilayers

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Proceedings Article | 1 October 1997 Paper

Needle optimization technique: the history and the future

Alexander Tikhonravov

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.290180

KEYWORDS: Refractive index, Transmittance, Coating, Optical coatings, Multilayers, Optimization (mathematics), Optical design, Thin films, Chemical elements, Thin film coatings

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Proceedings Article | 1 October 1997 Paper

Efficient refinement of inhomogeneous optical coatings: synthesis by simultaneous thickness and refractive-index optimization

Pierre Verly, Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 3133, (1997) https://doi.org/10.1117/12.279116

KEYWORDS: Refractive index, Optical coatings, Electronic filtering, Thin films, Multilayers, Reflectivity, Transmittance, Solids, Thin film coatings, Polarization

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Proceedings Article | 19 August 1996 Paper

Design of multilayers featuring inhomogenous coating properties

Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 2776, (1996) https://doi.org/10.1117/12.246843

KEYWORDS: Multilayers, Coating, Refractive index, Optical coatings, Transmittance, Reflectivity, Prototyping, Beam splitters, Thin films, Reflectors

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Proceedings Article | 19 August 1996 Paper

Study of thin film inhomogeneity with a fast-scanning acousto-optic spectrophotometer

Alexander Tikhonravov, Michael Trubetskov, Andrew Tikhonov, Oleg Tcherednichenko, Boris Lysoi, Ksenia Mikhailova, Brian Sullivan, Jerzy Dobrowolski

Proceedings Volume 2776, (1996) https://doi.org/10.1117/12.246817

KEYWORDS: Refractive index, Reflectivity, Thin films, Data modeling, Acousto-optics, Spectrophotometry, In situ metrology, Transmittance, Thin film deposition, Thin film devices

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Proceedings Article | 4 November 1994 Paper

Development of the needle optimization technique and new features of OptiLayer design software

Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192109

KEYWORDS: Refractive index, Optical coatings, Multilayers, Reflectivity, Software development, Beam splitters, Glasses, Ions, Antireflective coatings, Optical design

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Proceedings Article | 4 November 1994 Paper

Mathematical modeling and simulation of resonance field phenomena in thin films with periodic surface inhomogeneities

Alexander Tikhonravov, Aleksei Bikov

Proceedings Volume 2253, (1994) https://doi.org/10.1117/12.192059

KEYWORDS: Thin films, Matrices, Scattering, Refractive index, Mathematical modeling, Chemical elements, Electromagnetic radiation, Electromagnetic scattering, Electromagnetism, Waveguides

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Proceedings Article | 7 September 1994 Paper

Use of a new synthesis algorithm to design polarization insensitive optical coatings

Gary DeBell, Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 2262, (1994) https://doi.org/10.1117/12.185789

KEYWORDS: Refractive index, Optical coatings, Polarization, Optical design, Thin film coatings, Dielectric polarization, Optimization (mathematics), Glasses, Beam splitters, Antireflective coatings

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Proceedings Article | 2 November 1993 Paper

Mathematical aspects of the synthesis of inhomogeneous coatings

Alexander Tikhonravov

Proceedings Volume 2046, (1993) https://doi.org/10.1117/12.163555

KEYWORDS: Reflectivity, Refractive index, Optical coatings, Fourier transforms, Thin film coatings, Inverse optics, Reflection, Phase shifts, Multilayers, Thin films

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Proceedings Article | 2 November 1993 Paper

Program package for the ellipsometry of inhomogeneous layers

Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 2046, (1993) https://doi.org/10.1117/12.163546

KEYWORDS: Data modeling, Refractive index, Inverse problems, Mathematical modeling, Systems modeling, Thin films, Ellipsometry, Inverse optics, Software development, Data processing

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Proceedings Article | 2 November 1993 Paper

Multiple solutions to the synthesis of graded index optical coatings

Pierre Verly, Alexander Tikhonravov, A. Poezd

Proceedings Volume 2046, (1993) https://doi.org/10.1117/12.163551

KEYWORDS: Refractive index, Reflectivity, Optical coatings, Fourier transforms, Reflection, Transmittance, Coating, Phase shifts, Optical filters, Multilayers

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Proceedings Article | 2 November 1993 Paper

Series of optimal or near-optimal solutions to an antireflection problem

Jerzy Dobrowolski, Alexander Tikhonravov

Proceedings Volume 2046, (1993) https://doi.org/10.1117/12.163559

KEYWORDS: Refractive index, Antireflective coatings, Multilayers, Coating, Reflectivity, Computer programming, Interfaces, Glasses, Fourier transforms, Physics

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Proceedings Article | 4 March 1993 Paper

Thin-film coatings design using second-order optimization methods

Alexander Tikhonravov, Michael Trubetskov

Proceedings Volume 1782, (1993) https://doi.org/10.1117/12.141058

KEYWORDS: Optical coatings, Thin films, Thin film coatings, Reflectivity, Software development, Refractive index, Optical design, Optimization (mathematics), Transmittance, Multilayers

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Proceedings Article | 4 March 1993 Paper

Optimization of color properties of multielement optical lenses

Alexander Tikhonravov, Aleksei Bikov, Michael Trubetskov

Proceedings Volume 1782, (1993) https://doi.org/10.1117/12.141029

KEYWORDS: Lenses, Optical coatings, Antireflective coatings, Thin film coatings, Thin films, Refractive index, Lens design, Transmittance, Standards development, Glasses

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Proceedings Article | 1 August 1990 Paper

Optical coverings in modulators and deflectors in far-IR range

Iosif Sisakian, Alexander Tikhonravov, Alexander Shvartsburg, Andrew Shepelev

Proceedings Volume 1274, (1990) https://doi.org/10.1117/12.34680

KEYWORDS: Semiconductors, Reflectivity, Reflection, Plasma, Multilayers, Dielectrics, Electro optics, Refractive index, Modulation, Magneto-optics

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Proceedings Article | 1 August 1990 Paper

Investigation of scattering caused by thin film columnar structure

Aleksei Bikov, V. Popov, Alexander Tikhonravov

Proceedings Volume 1270, (1990) https://doi.org/10.1117/12.20390

KEYWORDS: Thin films, Scattering, Refractive index, Electromagnetic scattering, Numerical analysis, Electromagnetic radiation, Thin film coatings, Mathematical modeling, Computer simulations, 3D modeling

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Proceedings Article | 1 August 1990 Paper

Optimality of thin film optical coating design

Alexander Tikhonravov

Proceedings Volume 1270, (1990) https://doi.org/10.1117/12.20361

KEYWORDS: Coating, Thin film coatings, Optical coatings, Thin films, Ions, Optical design, Multilayers, Reflectivity, Polarization, Information operations

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Showing 5 of 47 publications

Conference Committee Involvement (5)

Advances in Optical Thin Films VIII

8 April 2024 | Strasbourg, France

Advances in Optical Thin Films VII

13 September 2021 | Online Only, Spain

Advances in Optical Thin Films VI

14 May 2018 | Frankfurt, Germany

Advances in Optical Thin Films V

7 September 2015 | Jena, Germany

Advances in Optical Thin Films IV

5 September 2011 | Marseille, France

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