Aleksandr S. Vasilev
Tutor at ITMO Univ
SPIE Involvement:
Author
Publications (7)

PROCEEDINGS ARTICLE | October 9, 2018
Proc. SPIE. 10796, Electro-Optical Remote Sensing XII
KEYWORDS: Image fusion, Visualization, Imaging systems, Sensors, Scintillators, Scintillation, Vacuum ultraviolet

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10334, Automated Visual Inspection and Machine Vision II
KEYWORDS: Light sources, Metrology, Light emitting diodes, Image processing, Error analysis, Manufacturing, Reflectivity, Buildings, Machine vision, Image filtering, Algorithm development

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Signal to noise ratio, Light emitting diodes, Image processing, Error analysis, Reliability, Control systems, Computer simulations, Image analysis, Buildings, Optoelectronics, Diodes, Signal detection, Active optics, Probability theory, Motion controllers

PROCEEDINGS ARTICLE | June 26, 2017
Proc. SPIE. 10330, Modeling Aspects in Optical Metrology VI
KEYWORDS: Optical components, Modeling, Photodetectors, Prisms, Polarization, Sensors, Wave plates, Polarimetry, Refraction, Image sensors, Transmittance, Spherical lenses, Jones vectors, Device simulation, Light

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9530, Automated Visual Inspection and Machine Vision
KEYWORDS: Mathematical modeling, Image fusion, Sensors, Image processing, Multispectral imaging, Surveillance, Optoelectronics, Image quality, Systems modeling, Image information entropy

PROCEEDINGS ARTICLE | June 22, 2015
Proc. SPIE. 9525, Optical Measurement Systems for Industrial Inspection IX
KEYWORDS: Metrology, Image processing, Manufacturing, Image acquisition, Field programmable gate arrays, Control systems, Buildings, Electro optics, Electro optical modeling, Temperature metrology

Showing 5 of 7 publications
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