Alexandre Fong
SPIE Involvement:
Author | Instructor
Area of Expertise:
Hyperspectral Imaging , Photometry and Radiometry , Displays , LEDs , Lidar , Aerospace
Profile Summary

Photonics, optical-mechanical hardware and systems design, engineering and integration.
- Data science, software engineering and algorithm development (i.e. Python, C, R, etc.)
- Life sciences, imaging, test and measurement instrumentation, aerospace systems and electronic components.
- Experienced strategic, general, sales and marketing management and technical product and business development professional.

- US citizen with international experience, eligible for security clearance.
- Proven successful track record in program management, operations, business development, OEM/B2B sales, marketing, public relations, communications and finance and public policy.
Publications (7)

Proceedings Article | 31 May 2022 Presentation + Paper
Proceedings Volume 12094, 120940J (2022)
KEYWORDS: Hyperspectral imaging, Chemical species, Sodium, Short wave infrared radiation, Cameras, Inspection, Fabry–Perot interferometers, Corrosion, Chemical analysis, Data modeling

Proceedings Article | 12 April 2021 Presentation + Paper
Proceedings Volume 11727, 1172714 (2021)
KEYWORDS: Agriculture, Spectroscopes, Liver, Kidney, Hyperspectral imaging, Heart, Fungi, Endocrine system, Contamination, Chromatography

Proceedings Article | 4 October 2020 Presentation + Paper
Proceedings Volume 11576, 115760C (2020)

Proceedings Article | 11 February 2011 Paper
Proceedings Volume 7932, 79320J (2011)
KEYWORDS: Reflectivity, Transmittance, Diffuse reflectance spectroscopy, Translucency, Optical filters, Sensors, Light sources, Integrating spheres, Digital micromirror devices, Digital Light Processing

Proceedings Article | 18 February 2010 Paper
Proceedings Volume 7596, 75960I (2010)
KEYWORDS: Solar cells, Light sources, Light, Digital micromirror devices, Photovoltaics, Modulation, Solar energy, Monochromators, Sun, Sensors

Showing 5 of 7 publications
Course Instructor
SC657: Accurate Measurement of LED Optical Properties
This course provides attendees with a working knowledge of the optical properties of LEDs and how to measure them correctly. The course concentrates on techniques for controlling variables that can lead to large errors. Traceability to NIST and uncertainty are explained clearly. Many practical examples are included throughout, including actual measurements of die and packaged LEDs. Attendees will be able to identify and control critical variables to give high accuracy measurements.
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