Alexandru-Ioan Schitea
at Aurel Vlaicu Univ of Arad
SPIE Involvement:
Author
Publications (1)

PROCEEDINGS ARTICLE | May 13, 2013
Proc. SPIE. 8789, Modeling Aspects in Optical Metrology IV
KEYWORDS: Prisms, Optical coherence tomography, Scanners, 3D modeling, Laser scanners, Mechanical engineering, Polygon scanners, Process modeling, Inverse optics, Instrument modeling

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