Dr. Alexei P. Sokolov
Professor at Univ of Akron
SPIE Involvement:
Author
Publications (8)

PROCEEDINGS ARTICLE | May 14, 2012
Proc. SPIE. 8378, Scanning Microscopies 2012: Advanced Microscopy Technologies for Defense, Homeland Security, Forensic, Life, Environmental, and Industrial Sciences
KEYWORDS: Plasmonics, Contamination, Silica, Silicon, Silver, Coating, Image resolution, Raman spectroscopy, Silicon films, Aluminum

PROCEEDINGS ARTICLE | April 16, 2008
Proc. SPIE. 6954, Chemical, Biological, Radiological, Nuclear, and Explosives (CBRNE) Sensing IX
KEYWORDS: Plasmonics, Metals, Silicon, Silver, Coating, Resistance, Surface enhanced Raman spectroscopy, Raman spectroscopy, Scanning probe microscopy, Near field optics

PROCEEDINGS ARTICLE | October 2, 2007
Proc. SPIE. 6765, Next-Generation Spectroscopic Technologies
KEYWORDS: Optical imaging, Microscopes, Plasmons, Silicon, Silver, Imaging spectroscopy, Raman spectroscopy, Near field scanning optical microscopy, Scanning probe microscopy, Near field optics

PROCEEDINGS ARTICLE | October 3, 2006
Proc. SPIE. 6324, Plasmonics: Nanoimaging, Nanofabrication, and their Applications II
KEYWORDS: Semiconductors, Nanostructures, Polymethylmethacrylate, Polarization, Spectroscopy, Silicon, Raman spectroscopy, Near field, Cadmium sulfide, Near field optics

PROCEEDINGS ARTICLE | April 20, 2006
Proc. SPIE. 6195, Nanophotonics
KEYWORDS: Gold, Plasmons, Optical properties, Particles, Silver, Optical microscopy, Optical testing, Raman spectroscopy, Near field scanning optical microscopy, Near field optics

PROCEEDINGS ARTICLE | September 1, 2005
Proc. SPIE. 5927, Plasmonics: Metallic Nanostructures and Their Optical Properties III
KEYWORDS: Statistical analysis, Polarization, Scattering, Metals, Spectroscopy, Silicon, Raman spectroscopy, Near field, Cadmium sulfide, Near field optics

Showing 5 of 8 publications
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